Searching for "Test-Cost Sensitive Naive Bayes Classification." – sorted by Relevance.

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Test-cost sensitive naive bayes classification
by Xiaoyong Chai, Lin Deng, Qiang Yang — 2004 — In Proc. 4th IEEE International Conference on Data Mining (ICDM’04
…Test-Cost Sensitive Naive Bayes Classification Xiaoyong Chai, Lin Deng and Qiang Yang Department…
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