Searching for "Synchronous Test Generation Model for Asynchronous Circuits." – sorted by Relevance.

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BIBLIOGRAPHY
by M. Abadir, A. P. Ambler, Economics Of Electronic Design, M. S. Abadir, M. A. Breuer, M. S. Abadir, J. K. Reghbati, Functional Testing Of Semiconductor R, M. Abramovici, M. A. Breuer, A. D. Friedman, Digital Systems Testing
…. Banerjee, S. T. Chakradhar, and R. K. Roy, "Synchronous Test Generation Model for Asynchronous Circuits…
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SPIN-TEST: Automatic Test Pattern Generation for Speed-Independent Circuits
by Feng Shi
… with hazards or races, however, are invalid for testing asynchronous circuits. Moreover, a test generation…
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