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Searching for "Synchronization overhead in SOC compressed test." – sorted by Relevance.

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  • by X. Kavousianos, E. Kalligeros, D. Nikolos, Test-data Compression — 2003
  • …, “Synchronization overhead in SOC compressed test,” IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 13, no…
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