Searching for "Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharing." – sorted by Relevance.

Order by: Citations | Year (Descending) | Year (Ascending) | Recency

Try your query at: Scholar | Yahoo! | Ask | Bing | CSB

1 documents found, showing 1 through 1.

Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge
by R. Iris Bahar, Hui-yuan Song, Kundan Nepal, Student Member, Student Member, Joel Grodstein — 2005 — Transactions on Computer Aided Design of Integrated Circuits and Systems
… 2004 1 Symbolic Failure Analysis of Complex CMOS Circuits due to Excessive Leakage Current and Charge…
Cited by 1 (1 self) – Add To MetaCart

Showing 1 through 1.

Try your query at: Scholar | Yahoo! | Ask | Bing | CSB