Searching for "Securing Scan Design Using Lock and Key Technique." – sorted by Relevance.

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Securing Scan Design Using Lock & Key Technique
by Jeremy Lee, Mohammed Tehranipoor, Chintan Patel, Jim Plusquellic — 2005 — in IEEE Intl. Symposium on Defect and Fault Tolerance (DFT’05
…Securing Scan Design Using Lock & Key Technique Jeremy Lee, Mohammed Tehranipoor, Chintan Patel…
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