Searching for "Partitioning Circuits for Improved Testability." – sorted by Relevance.

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SPARTAN: A Spectral and Information Theoretic Approach to Partial-Scan
by Omar I. Khan, Michael L. Bushnell, Suresh K. Devanathan, Vishwani D. Agrawal
… in flops for scan. This improves the testability of the circuit-under- full-scan mode, but of the 6475…
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