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Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation
by Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxena, Elizabeth M. Rudnick, Janak H. Patel, Prithviraj Banerjee — 1997 — IEEE VLSI Design Conference
… of the test generator. 3 Parallel Genetic Algorithms for Simulation-Based Testing Previous parallel…
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