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Searching for "On Optimizing Fault Coverage" – sorted by Relevance.

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12 documents found, showing 1 through 10. Next 10 →

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A New Test/Diagnosis/Rework Model for Use in Technical Cost Modeling of Electronic Systems Assembly
by Thiagarajan Trichy, Peter S, Ravi Raghavan, Shubhada Sahasrabudhe — 2001 — In Proceedings of ITC 2001
… to optimize the fault coverage and rework investment during system tradeoff analyses. The model…
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Fault Coverage Evaluation of Protocol Test Sequences
by C Fl Jinsong Zhu, Jinsong Zhu, Jinsong Zhu, Samuel T. Chanson, Samuel T. Chanson, Samuel T. Chanson — 1993 — Proc. of the 14th IFIP Symposium on Protocol Specification, Testing and Verification
… of optimization on fault coverage, is therefore important both in practice and in theory. In [5, 15], a simulation…
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ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values
by unknown authors
… of generating control signals for this selection scheme is also proposed to optimize the fault coverage. Figure…
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Fault Coverage Analysis For Physically-Based CMOS Bridging Faults At Different Power Supply
by Yuyun Liao, D. M. H. Walker — 1996
… in terms of fault coverage. So, for the fault in Fig. 8 the optimal strategy will rst try to sensitize…
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An Approach to Realistic Fault Prediction and Layout Design for
by Testability In Analog, J. A. Prieto, A. Rueda, I. Grout, E. Peralías, J. L. Huertas, A. M. D. Richardson — 1998 — in Design, Automation and Test in Europe (DATE
… of difficult to detect faults in order to optimize the fault coverage figure. This process needs four main…
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Exploit Analog IFA to Improve Specification Based Tests
by Bert Atzema Taco, Bert Atzema, Taco Zwemstra — 1996 — In The European Design and Test Conference
… or the design itself can be optimized increasing the fault coverage of the required functional tests…
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SWITTEST: Automatic Switch-level Fault Simulation and Test Evaluation of Switched-Capacitor Systems
by S. Mir, A. Rueda, T. Olbrich, E. Peralías, J.L. Huertas — 1997
… typical test goal is to achieve a fault coverage as close as possible to 100%. To reach an optimal fault…
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c ○ 2000 Kluwer Academic Publishers. Manufactured in The Netherlands. On Random Pattern Testability of Cryptographic VLSI Cores
by A. Schubert, W. Anheier, C. Landrault — 1999
… properties of the LFSR and of the expansion are the reason for the non-optimal fault coverage in case…
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Power Conscious BIST Approaches
by Arnaud Virazel, Hans-joachim Wunderlich
… the targeted fault coverage, the total energy consumed in the circuit during application of the complete test…
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Consequences of Port Restrictions on Testing Address Decoder Faults in Two-Port Memories
by Hamdioui Van De, A. J. Goor — 1998
… to be performed for an optimal fault coverage, is also impacted by port restrictions. In this paper, the impact…
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