Searching for authors named "Nilanjan Mukherjee" – sorted by Relevance.
3 documents found, showing 1 through 3.
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Achieving High Test Quality with Reduced Pin Count Testing," ATS
- … Jahangiri, Mentor Graphics Corporation, Wilsonville, OR, USA 97070 2. Nilanjan Mukherjee, -- Do – 3. Wu…
- Cited by 2 (0 self) – Add To MetaCart
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Effect of RTL Coding Style On Testability*
- …Effect of RTL Coding Style On Testability* Yu Huang' Chien-Chung Tsai2 Nilanjan Mukherjee' Wu…
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Embedded Deterministic Test for Low Cost Manufacturing Test
- … Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz…
- Cited by 54 (3 self) – Add To MetaCart
Showing 1 through 3.
