Searching for authors named "Nagesh Tamarapalli" – sorted by Relevance.
-
Logic BIST for large industrial designs: Real issues and case studies
- Fryars Nagesh Tamarapalli, Mark Kassab, Abu Hassan, and Janusz Rajski Texas Instruments, Ltd. Mentor
- Cited by 34 (2 self) – Add To MetaCart
-
Yield Learning with Layout-aware Advanced Scan Diagnosis
- Semiconductor Manufacturing Company, Hsinchu Taiwan R.O.C. Nagesh Tamarapalli * , Wu-Tung Cheng, Jan Tofte
- Cited by 1 (0 self) – Add To MetaCart
-
Embedded Deterministic Test for Low Cost Manufacturing Test
- Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz
- Cited by 54 (3 self) – Add To MetaCart

