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Model-Based Test Case Generation for Smart Cards
by J. Philipps, A. Pretschner, O. Slotosch, E. Aiglstorfer, S. Kriebel, K. Scholl B — 2003
…://www.elsevier.nl/locate/entcs/volume80.html LastPage pages Model-Based Test Case Generation for Smart Cards 1 J. Philipps a , A…
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