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Searching for authors named "Min Cao" – sorted by Relevance.

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  • Characterization of Ultrathin Gate Oxide Thickness (1.3-1.8 nm)  
  • by Chang-hoon Choi, Jung-suk Goo, Tae-young Oh, Zhiping Yu, Robert W. Dutton, Amr Bayoumi, Min Cao, Paul Vande Voorde, Paul V, E Voorde, Dieter Vook, C. H. Diaz — 1999
  • …. Dutton, Amr Bayoumi, Min Cao, Paul Vande Voorde, Dieter Vook, and C. H. Diaz Abstract— An equivalent…
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  • C--V and Gate Tunneling Current Characterization of Ultra-Thin Gate Oxide MOS (t  
  • by Nm Chang-Hoon Choi, Chang-hoon Choi, Jung-suk Goo, Tae-young Oh, Zhiping Yu, Robert W. Dutton, Amr Bayoumi, Min Cao, Paul V, E Voorde, Dieter Vook — 1999 — MOS (tox=1.3-1.8 nm),” IEEE Symposium on VLSI Technology Digest of Technical Papers, pages 63 – 64
  • … Systems, Stanford University, Stanford, CA 94305-4075, USA Amr Bayoumi, Min Cao, Paul Vande Voorde…
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