Searching for authors named "Mike Rodgers" – sorted by Relevance.
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March SS: A Test for All Static Simple RAM Faults
- March SS: A Test for All Static Simple RAM Faults Said Hamdioui 1�2 Ad J. van de Goor 2 Mike
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Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests
- of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands MIKE RODGERS Intel Corporation, 2200 Mission College
- Cited by 6 (2 self) – Add To MetaCart
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Test challenges for deep sub-micron technologies
- Test Challenges for Deep Sub-Micron Technologies Kwang–Ting (Tim) Cheng 1 , Sujit Dey 2 , Mike
- Cited by 8 (2 self) – Add To MetaCart
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Detecting Intra-Word Faults in Word-Oriented Memories
- Detecting Intra-Word Faults in Word-Oriented Memories Said Hamdioui � Ad J. van de Goor Mike
- Cited by 1 (1 self) – Add To MetaCart
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March SL: A Test For All Static Linked Memory Faults
- Mike Rodgers Delft University of Technology, Faculty of Information Technology and Systems Computer
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Linked Faults in Random Access Memories: Concept, Fault Models, Test Algorithms, . . .
- , and Mike Rodgers, Member, IEEE Abstract—The analysis of linked faults (LFs), which are faults
- Cited by 2 (2 self) – Add To MetaCart

