Searching for authors named "Mick Tegethoff" – sorted by Relevance.
5 documents found, showing 1 through 5.
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ASIC Manufacturing Test Cost Prediction at Early Design Stage
- …ASIC Manufacturing Test Cost Prediction at Early Design Stage Von-Kyoung Kim 1 Tom Chen 2 Mick…
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ASIC Yield Estimation At Early Design Cycle
- …ASIC Yield Estimation At Early Design Cycle Vonkyoung Kim Mick Tegethoff* Tom Chen Department…
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MANUFACTURING TEST SIMULATOR: A CONCURRENT ENGINEERING TOOL FOR BOARDs and MCMs
- …1 MANUFACTURING TEST SIMULATOR: A CONCURRENT ENGINEERING TOOL FOR BOARDs and MCMs Mick M…
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On Clustering Of Defects And Yield Of Smt Assemblies
- …1 ON CLUSTERING OF DEFECTS AND YIELD OF SMT ASSEMBLIES Mick M.V. Tegethoff Hewlett…
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Defects, Fault Coverage, Yield And Cost, In Board Manufacturing
- … AND COST, IN BOARD MANUFACTURING Mick M.V. Tegethoff * Hewlett--Packard Company 3404 E. Harmony Rd., Fort…
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