Searching for authors named "Michele Favalli" – sorted by Relevance.
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Testing scheme for IC's clocks
- This paper proposes a testing scheme to detect ab# normal skews between clock signals inside digital syn# chronous ICs. The scheme is based on a new CMOS sensing circuit whose compactness and testability with respect to a large set of failures make it suitable for both o##line and on#line testing.
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An Evolutionary Approach to the Design of on-Chip
- s of a uniform distribution. Conversely, the actual correlations of the TPG output signals may be successfully exploited by the WGU if it is properly designed. In fact, this is a good way to catch such faults whose detection is mainly dominated by second order coefficients such as in the above menti
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Highly Testable and Compact
- This paper presents a novel 1-out-of-n checker that, compared to the other implementations up to now presented, features the advantages of: i) satisfying the TSC or SCD property with respect to all possible internal faults representative of realistic failures; ii) presenting a single output line; ii
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