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Measuring and Improving Design Patterns Testability
by Benoit Baudry, Yves Le Traon, Gerson Sunyé — 2003 — in: 9th IEEE International Software Metrics Symposium (METRICS 2003), IEEE Computer Society
…** Measuring and Improving Design Patterns Testability Benoit Baudry * , Yves Le Traon * , Gerson…
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