Searching for authors named "Martin Kaibel" – sorted by Relevance.

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Logic Design for On-Chip Test Clock Generation
by Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl — 2005 — Implementation Details and Impact on Delay Test Quality,” Proc. Design Automation & Test Conference Europe
… Quality Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl Infineon Technologies AG Balanstrasse…
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