Searching for "Macro Testability The Results of Production Device Applications." – sorted by Relevance.

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[76] Prab Varma and Sandeep Bhatia. A Structured Test Re-Use Methodology for Core-Based System Chips. In
by Proceedings Ieee, Erik Jan Marinissen, Prab Varma
…, Steven Oostdijk, Rudi Stans, Ben Bennetts, and Frans Beenker. Macro Testability; The Results…
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