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Searching for "Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation." – sorted by Relevance.

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  • Low-Power Transition-Delay Fault Pattern Generation  
  • by Advisor Dr, John A. Ch, Advisor Dr, John A. Ch, Client Storagetek, Sun Microsystems, Jeremy Lee, Sumit Narayan, Mohammad Tehranipoor, Jeremy Lee, Sumit Narayan, Mike Kapralos, Mohammad Tehranipoor, Sumit Narayan — 2004
  • … and Mohammad Tehranipoor in IEEE North Atlantic Test Workshop (NATW), Boxborough, MA. May 2008 Layout-aware, IR-Drop
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