Searching for authors named "Kyung Ki Kim" – sorted by Relevance.

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Data Dependent Jitter (DDJ) Characterization Methodology
by Kyung Ki Kim, Yong-bin Kim, Fabrizio Lombardi — IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
…Data Dependent Jitter (DDJ) Characterization Methodology Kyung Ki Kim, Yong-Bin Kim, Fabrizio…
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