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Searching for authors named "Kypros Constantinides" – sorted by Relevance.

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  • Online Design Bug Detection: RTL Analysis, Flexible Mechanisms, and Evaluation  
  • by Kypros Constantinides, Onur Mutlu, Todd Austin
  • …Higher level of resource integration and the addition of new features in modern multi-processors put a significant pressure on their verification. Although a large amount of resources and time are devoted to the verification phase of modern processors, many design bugs escape the verification proces…
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  • Ultra low-cost defect protection for microprocessor pipelines  
  • by Smitha Shyam, Kypros Constantinides, Sujay Phadke, Valeria Bertacco, Todd Austin — 2006 — In Proceedings of the 12th International conference on Architectural Support for Programming Languages and Operating Systems (ASPLOS
  • …The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Silicon failure mechanisms, such as transistor wearout and manufacturing defects, are a growing challenge that threatens the…
  • Cited by 7 (1 self)Add To MetaCart
  • BulletProof: A Defect-Tolerant CMP Switch Architecture  
  • by Kypros Constantinides, Stephen Plaza, Jason Blome, Bin Zhang, Valeria Bertacco, Scott Mahlke, Todd Austin, Michael Orshansky — 2006 — In Proceedings of the 12th International Symposium on High Performance Computer Architecture
  • …As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transient errors, and transistor wear-out. Unless these challenges are addressed, computer vendors can expect low yields and sho…
  • Cited by 11 (4 self)Add To MetaCart
  • Assessing SEU vulnerability via circuit-level timing analysis  
  • by Kypros Constantinides, Stephen Plaza, Jason Blome, Bin Zhang, Valeria Bertacco, Scott Mahlke, Todd Austin, Michael Orshansky — 2005 — In Proceedings of the 1st Workshop on Architectural Reliability
  • …Recently, there has been a growing concern that, in relation to process technology scaling, the soft-error rate will become a major challenge in designing reliable systems. In this work, we introduce a high-fidelity, high-performance simulation infrastructure for quantifying the derating effects on …
  • Cited by 1 (0 self)Add To MetaCart
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