Searching for authors named "Keejong Kim" – sorted by Relevance.

Order by: Citations | Year (Descending) | Year (Ascending) | Recency

Try your query at: Scholar | Yahoo! | Ask | Bing | CSB

1 documents found, showing 1 through 1.

Characterization and Estimation of Circuit Reliability Degradation under NBTI using
by Kunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad A. Alam, Kaushik Roy — 2007 — On-Line IDDQ Measurement,” Proc. Design Automation Conference
… Measurement ∗ Kunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad A. Alam, and Kaushik Roy School…
Cited by 1 (0 self) – Add To MetaCart

Showing 1 through 1.

Try your query at: Scholar | Yahoo! | Ask | Bing | CSB