Searching for authors named "Kartik Mohanram" – sorted by Relevance.

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8 documents found, showing 1 through 8.

Abstract Transistor Sizing for Radiation Hardening
by Quming Zhou, Kartik Mohanram
…Abstract Transistor Sizing for Radiation Hardening Quming Zhou and Kartik Mohanram Department…
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Accurate
by Mihir R. Choudhury, Kartik Mohanram
… and Kartik Mohanram Department of Electrical and Computer Engineering Rice University, Houston, TX 77005…
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Input Ordering in Concurrent Checkers to Reduce Power Consumption
by Kartik Mohanram, Nur A. Touba — 2002 — Proc. of IEEE Symposium on Defect and Fault Tolerance
…Input Ordering in Concurrent Checkers to Reduce Power Consumption Kartik Mohanram and Nur A. Touba…
Cited by 8 (2 self) – Add To MetaCart

Partial Error Masking to Reduce Soft Error Failure Rate in Logic Circuits
by Kartik Mohanram, Nur A. Touba — 1997 — Proc. of IEEE Symposium on Defect and Fault Tolerance
…Partial Error Masking to Reduce Soft Error Failure Rate in Logic Circuits Kartik Mohanram…
Cited by 10 (0 self) – Add To MetaCart

Cost-effective approach for reducing soft error failure rate in logic circuits
by Kartik Mohanram, Nur A. Touba — 2003
…Cost-Effective Approach for Reducing Soft Error Failure Rate in Logic Circuits Kartik Mohanram…
Cited by 54 (5 self) – Add To MetaCart

Gate sizing to radiation harden combinational logic
by Quming Zhou, Student Member, Kartik Mohanram — 2006 — Area Overhead (%) 23.91 31.30 27.05 27.05 26.75 62.06 32.03 44.74 29.62 66.22 1.3 T spec 30.98 32.80 29.24 33.55 24.15 52.96 7.70 30.78 31.62 60.17 17.43 29.32 40.55 54.31 8.21 29.37 40.77 61.23 12.37 16.71 37.47 Q 1 =15fC Q 2 =20fC 24.72 41.75 Q 1 =15fC
…, and Kartik Mohanram, Member, IEEE Abstract—A gate-level radiation hardening technique for cost– effective…
Cited by 12 (2 self) – Add To MetaCart

An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets
by Abhijit Jas, Kartik Mohanram, Nur A. Touba — 1999 — in ATS
…An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets Abhijit Jas, Kartik Mohanram…
Cited by 2 (0 self) – Add To MetaCart

Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits
by Kartik Mohanram Egor, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba — 2003 — Proc. of International On-Line Test Symposium
…Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits Kartik Mohanram † Egor S…
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Showing 1 through 8.

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