Searching for authors named "Jonathan Chang" – sorted by Relevance.
18 documents found, showing 1 through 10.
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Quantitative Analysis of Very-Low-Voltage Testing
- … in Jonathan T.-Y. Chang and Edward J. McCluskey Center for Reliable Computing Stanford University, Stanford…
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Detecting Delay Flaws By Very-Low-Voltage Testing
- … Jonathan T.-Y. Chang and Edward J. McCluskey Center for Reliable Computing Stanford University Gates Hall 2…
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Voltage Screens Early-Life Failures In Cmos Integrated Circuits
- … FULFILLMENT OF THE REQUIREMENTS FOR THE DEGREE OF DOCTOR OF PHILOSOPHY By Tsung-Yung Jonathan Chang June 1998…
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PU-BCD: Exponential Family Models for the Coarse- and Fine-Grained All-Words Tasks
- …PU-BCD: Exponential Family Models for the Coarse- and Fine-Grained All-Words Tasks Jonathan Chang…
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UNISIM: An Open Simulation Environment and Library for Complex Architecture Design and Collaborative Development
- … and Collaborative Development David August † , Jonathan Chang † , Sylvain Girbal ∗ , Daniel Gracia-Perez ‡ , Gilles…
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Automatic Instruction-Level Software-Only Recovery Methods
- …Automatic Instruction-Level Software-Only Recovery Jonathan Chang George A. Reis David I. August…
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S.S.: Configurable Transient Fault Detection via Dynamic Binary Translation
- … Jonathan Chang David I. August Depts. of Electrical Engineering and Computer Science Princeton University…
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Analysis And Detection Of Timing Failures In An Experimental Test Chip
- … † , Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, E. J. McCluskey Center for Reliable Computing Stanford…
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SHOrt Voltage Elevation (SHOVE) Test
- … sort. It can screen out weak parts during a wafer-level test and Jonathan T.-Y. Chang and Edward J. Mc…
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SHOrt Voltage Elevation (SHOVE) Test for Weak CMOS ICs
- …, or portions thereof, in any form. SHOrt Voltage Elevation (SHOVE) Test for Weak CMOS ICs Jonathan T.-Y. Chang…
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