Searching for authors named "John Kibarian" – sorted by Relevance.

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Simulating the impact of pattern-dependent poly-CD variation on circuit performance
by Brian E. Stine, Duane S. Boning, James E. Chung, Dennis J. Ciplickas, John K. Kibarian — 1998 — Proc. IEEE Vol. 11 #4, Transactions on Semiconductor Manufacturing
…, Member, IEEE, James E. Chung, Member, IEEE, Dennis J. Ciplickas, and John K. Kibarian Abstract…
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