Searching for authors named "Janusz Rajski" – sorted by Relevance.
14 documents found, showing 1 through 10.
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Nanometer Design: What are the Requirements for Manufacturing Test?
- …Nanometer Design: What are the Requirements for Manufacturing Test? Janusz Rajski and Kan Thapar…
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Multiplicative Window Generators of Pseudo-random Test Vectors
- ….00 © 1996 IEEE Janusz Rajski Jerzy Tyszer Mentor Graphics Corporation The Franco-Polish School of New 8005…
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A fast sequential learning technique for real circuits with application to enhancing ATPG performance
- … Performance Aiman El-Maleh, Mark Kassab, and Janusz Rajski Mentor Graphics Corporation 8005 S.W. Boeckman Rd…
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An Efficient BIST Scheme Based on Reseeding of Multiple Polynomial Linear Feedback Shift Registers
- … Srikanth Venkataraman* Janusz Rajski* Sybille Hellebrand** Steffen Tarnick*** *MACS Laboratory, Mc…
- Cited by 23 (1 self) – Add To MetaCart
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Generation Of Vector Patterns Through Reseeding Of Multiple-Polynomial Linear Feedback Shift Registers
- … Tarnick ** , Janusz Rajski *** and Bernard Courtois TIM3/IMAG 46, avenue F��lix Viallet 38031 GRENOBLE…
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Fault diagnosis in designs with convolutional compactors,” ITC
- …FAULT DIAGNOSIS IN DESIGNS WITH CONVOLUTIONAL COMPACTORS Grzegorz Mrugalski, Artur Pogiel*, Janusz…
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Generation Of Vector Patterns Through Reseeding Of Multiple-Polynomial Linear Feedback Shift Registers
- … Tarnick ** , Janusz Rajski *** and Bernard Courtois TIM3/IMAG 46, avenue Flix Viallet 38031 GRENOBLE…
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An Efficient BIST Scheme Based on Reseeding of Multiple Polynomial Linear Feedback Shift Registers
- … Srikanth Venkataraman* Janusz Rajski* Sybille Hellebrand** Steffen Tarnick*** *MACS Laboratory, Mc…
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Logic BIST for large industrial designs: Real issues and case studies
- … Fryars Nagesh Tamarapalli, Mark Kassab, Abu Hassan, and Janusz Rajski Texas Instruments, Ltd. Mentor…
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Accumulator-Based Compaction of Test Responses
- … Wilsonville, OR 97070, USA Janusz Rajski, Jerzy Tyszer * , Chen Wang, Sudhakar M. Reddy ** Abstract This paper…
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