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JExample: Exploiting Dependencies Between Tests to Improve Defect Localization
by Adrian Kuhn, Bart Van Rompaey, Lea Haensenberger, Oscar Nierstrasz, Serge Demeyer, Markus Gaelli, Koenraad Van Leemput
…JExample: Exploiting Dependencies Between Tests to Improve Defect Localization Adrian Kuhn 1…
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