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Generation of Electrically Induced Stimuli for MEMS self-test
by B. Charlot, S. Mir, F. Parrain, B. Courtois, Josfi Fouii, Benoit Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois, Benoit Charlot(jmag. Fr, Salvador Mir(_ Imag. Fr — 2001 — Journal of Electronic Testing: Theory and Applications
…ISSN 1292-862 TIMA Lab. Research Reports Generation of Electrically Induced Stimuli for MEMS self-test…
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