Searching for "Evaluating Transient Error Effects in Digital Nanometer Circuits." – sorted by Relevance.

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Analysis and Design of Transient-Error-Tolerant Nanometer Circuits and Systems
by Chong Zhao, Chung-kuan Cheng, Rajesh Gupta, Bill Lin, Curt Schurgers, Sujit Dey Chair — 2007
… Dey, “Evaluating transient error effects in digital nanometer circuits”, accepted by IEEE Transactions…
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