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Searching for "Embedded Deterministic Test for Low-Cost Manufacturing Test." – sorted by Relevance.

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  • Embedded Deterministic Test for Low Cost Manufacturing Test  
  • by Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski — 2002 — Proc. of Int. Test Conf
  • …EMBEDDED DETERMINISTIC TEST FOR LOW COST MANUFACTURING TEST Janusz Rajski, Jerzy Tyszer * , Mark…
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  • 74–78.  
  • by I. Hamzaoglu, J. H. Patel, H. Liang, S. Hellebr, H. -j. Wunderlich, Two-dimensional Test, J. Rajski, J. Tyszer, M. Kassab, N. Kukherjee, R. Thompson, K. -h. Tsai, J. Qian — 2001
  • … for low cost manufacturing test,” in Proc. Int. Test Conf., 2002, pp. 301–310. [10] A. Jas, B. Pouya…
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