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Efficient space/time compression to reduce test data volume and testing time for IP cores
by Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Shivakumar Swaminathan — 2005 — In VLSID05: Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
…Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores ⋆ Lei Li…
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by X. Kavousianos, E. Kalligeros, D. Nikolos, Test-data Compression — 2003
… to reduce test data volume and testing time for IP cores,” in Proc. 18th Int. Conf. VLSI Des., 2005, pp. 53…
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