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Dynamic Fine-Grain Leakage Reduction Using Leakage-Biased Bitlines
by Seongmoo Heo, Kenneth Barr, Mark Hampton, Krste Asanovic — 2002 — In Proceedings of the 29th Annual International Symposium on Computer Architecture
…, May 2002 Dynamic Fine-Grain Leakage Reduction Using Leakage-Biased Bitlines Seongmoo Heo, Kenneth Barr…
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