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Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests
by Said Hamdioui, Zaid Al-ars, Ad, J. Van, De Goor, Mike Rodgers, A. Ivanov — 2003 — Journal of Electronic Testing: Theory and Applications
… Publishers. Manufactured in The Netherlands. Dynamic Faults in Random-Access-Memories: Concept, Fault Models…
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