Searching for "Diagnostic test generation for sequential circuits." – sorted by Relevance.

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Diagnostic Test Generation for Sequential Circuits
by Xiaoming Yu Jue, Xiaoming Yu, Jue Wu, Elizabeth M. Rudnick — Proc. Int. Test Conf. 2000, Atlantic City, NJ
…, the resulting test sets are long. Generation of diagnostic tests for sequential circuits is a complex problem…
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Diagnostic Test Pattern Generation For Sequential Circuits
by Ismed Hartanto, Vamsi Boppana, Janak H. Patel, W. Kent Fuchs — 1997 — Proc. IEEE VLSI Test Symp
…DIAGNOSTIC TEST PATTERN GENERATION FOR SEQUENTIAL CIRCUITS Ismed Hartanto y , Vamsi Boppana…
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