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by M. Abadir, A. P. Ambler, Economics Of Electronic Design, M. S. Abadir, M. A. Breuer, M. S. Abadir, J. K. Reghbati, Functional Testing Of Semiconductor R, M. Abramovici, M. A. Breuer, A. D. Friedman, Digital Systems Testing
…, "Deriving Logic Systems for Path Delay Test Generation," IEEE Trans. on Computers, vol. 47, no. 8, pp. 829…
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