Searching for "Delay Test Quality Evaluation Using Bounded Gate Delays." – sorted by Relevance.

Order by: Citations | Year (Descending) | Year (Ascending) | Recency

Try your query at: Scholar | Yahoo! | Ask | Bing | CSB

1 documents found, showing 1 through 1.

Delay Test Quality Evaluation using Bounded Gate Delays
by Soumitra Bose, Vishwani D. Agrawal — 2007 — in Proc. 25th IEEE VLSI Test Symp
…Delay Test Quality Evaluation Using Bounded Gate Delays Soumitra Bose Vishwani D. Agrawal Design…
Cited by 5 (3 self) – Add To MetaCart

Showing 1 through 1.

Try your query at: Scholar | Yahoo! | Ask | Bing | CSB