MetaCart Sign in to MyCiteSeerX

Include Citations | Advanced Search | Help

Disambiguated Search | Include Citations | Advanced Search | Help

Searching for "Comments on "Test efficiency analysis of random self-test of sequential circuits"." – sorted by Relevance.

Order by: Citations | Year (Descending) | Year (Ascending) | Recency
Try your query at: Scholar | Yahoo! | Ask | Bing | CSB
Help! 682,245 documents found, showing 1 through 10. Next 10 →
ATOM RSS
  • Evolving Cellular Automata for Self-Testing Hardware  
  • by Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero — 2000 — rd International Conference on Evolvable Systems: From Biology to Hardware (ICES-2000), Edinburgh (UK
  • … and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular…
  • Cited by 3 (1 self) – Add To MetaCart
  • Synthesis of Self-Testable Controllers  
  • by Sybille Hellebrand Hans-Joachim — 1994
  • … to implement a built-in self-test in two sessions without any extra test registers. Hence the additional delay…
  • Add To MetaCart
  • Built-In Self-Testing of Micropipelines  
  • by Petlin Furber Department, O. A. Petlin, S. B. Furber — 1997 — In Proc. International Symposium on Advanced Research in Asynchronous Circuits and Systems
  • … and analyse the responses of the circuit. A classical example of InSitu self-test is the BILBO technique…
  • Add To MetaCart
  • Automatic Synthesis of Self-Test Using ASyST  
  • by Peter Johnson, Joel Ferguson, Kevin Karplus, Tracy Larrabee — 1991
  • …'s self-test flip-flop. : : : : : : : : : : : : : : : : : : : : : : 16 5.1 Benchmark circuit…
  • Add To MetaCart
Help! Showing 1 through 10. Next 10 →
ATOM RSS
Try your query at: Scholar | Yahoo! | Ask | Bing | CSB