Searching for authors named "Chauchin Su" – sorted by Relevance.
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Decentralized BIST for 1149.1 and 1149.5 Based Interconnects
- Decentralized BIST for 1149.1 and 1149.5 Based Interconnects Chauchin Su, Shyh-Jye Jou Yuan
- Cited by 2 (0 self) – Add To MetaCart
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All Digital Built-in Delay and Crosstalk Measurement for On-Chip Buses
- All Digital Built-in Delay and Crosstalk Measurement for On-Chip Buses Chauchin Su, Yue-Tsang Chen
- Cited by 5 (1 self) – Add To MetaCart
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State and Fault Information for Compaction-Based Test Generation
- @(email omitted); Received May 16, 2001; Revised July 21, 2001 Editor: Chauchin Su Abstract. We present a new test generation
- Cited by 1 (1 self) – Add To MetaCart
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cllee @ cc.nctu.edu.tw
- of Electronics Engineering, National Chiao Tung University cllee @ cc.nctu.edu.tw Chauchin Su Jwu-E Chen
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Multilevel full-chip routing with testability and yield enhancement
- .-L. Lee 1 , Yao-Wen Chang 2 , Chauchin Su 3 , Jwu E. Chen 4 1 Department of Electronics Engineering
- Cited by 3 (3 self) – Add To MetaCart
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IEEE Standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
- Katherine Shu-Min Li, Member, IEEE, Chauchin Su, Member, IEEE, Yao-Wen Chang, Member, IEEE, Chung-Len Lee
- Cited by 1 (1 self) – Add To MetaCart

