Searching for authors named "Chaowen Yu" – sorted by Relevance.

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A scan BIST generation method using a Markov source and partial bit-fixing
by Wei Li, Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz — in Proc. ACM/IEEE Design Automation Conf
…A Scan BIST Generation Method Using A Markov Source And Partial Bit-Fixing Wei Li Chaowen Yu…
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