Searching for "CMOS Standard Cells Characterization for Defect Based Testing." – sorted by Relevance.

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CMOS Standard Cells Characterization for Defect Based Testing
by Witold A. Pleskacz, Dominik Kasprowicz, Tomasz Oleszczak, Wieslaw Kuzmicz — 2001 — Proc. DFT’01
… 2001 CMOS Standard Cells Characterization for Defect Based Testing Witold A. Pleskacz, Dominik…
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