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2 documents found, showing 1 through 2.

Automatic Test Pattern Generation for Functional RTL Circuits Using Assignment Decision Diagrams
by Indradeep Ghosh, Masahiro Fujita — 2000 — Proc. of ACM/IEEE DAC
…Automatic Test Pattern Generation for Functional RTL Circuits Using Assignment Decision Diagrams…
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Spectral RTL Test Generation for Gate-Level Stuck-at Faults
by Nitin Yogi, Vishwani D. Agrawal — 2006 — in Proc. 15th Asian Test Symposium
…. Ghosh and M. Fujita, “Automatic Test Pattern Generation for Functional RTL Circuits Using Assignment…
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