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Searching for authors named "Atul Maheshwari" – sorted by Relevance.

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3 documents found, showing 1 through 3.

ATOM

Techniques for transient fault sensitivity analysis and reduction
by Atul Maheshwari, Israel Koren, Wayne Burleson — 2003 — in VLSI circuits,” IEEE Intl. Symp. on Defect and Fault Tolerance in VLSI Systems
…Techniques for transient fault sensitivity analysis and reduction in VLSI circuits Atul Maheshwari…
Cited by 2 (0 self) – Add To MetaCart

R.Tessier, Trading off reliability and power-consumption in ultra-low power systems
by Atul Maheshwari, Wayne Burleson, Russell Tessier — 2002 — Proceedings of the International Symposium on Quality Electronic Design
…Trading off Reliability and Power-Consumption in Ultra-Low Power Systems Atul Maheshwari Wayne…
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Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits
by Atul Maheshwari, Student Member, Wayne Burleson, Senior Member, Russell Tessier — 2004 — IEEE transactions on
… Trading Off Transient Fault Tolerance and Power Consumption in Deep Submicron (DSM) VLSI Circuits Atul…
Cited by 5 (0 self) – Add To MetaCart

Showing 1 through 3.

ATOM

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