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An IC Manufacturing Yield Model Considering Intra-Die Variations
by Jianfeng Luo, Subarna Sinha, Qing Su, Jamil Kawa, Charles Chiang — in Proceedings of ACM/IEEE 43rd Design Automation Conference, 2006
…An IC Manufacturing Yield Model Considering Intra-Die Variations Jianfeng Luo, Subarna Sinha, Qing…
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