Searching for "Achieving High Test Quality with Reduced Pin Count Testing." – sorted by Relevance.

Order by: Citations | Year (Descending) | Year (Ascending) | Recency

Try your query at: Scholar | Yahoo! | Ask | Bing | CSB

1 documents found, showing 1 through 1.

Achieving High Test Quality with Reduced Pin Count Testing," ATS
by Jay Jahangiri, Nilanjan Mukherjee, Nilanjan Mukherjee, Wu-tung Cheng, Subramanian Mahadevan, Ron Press — 2005
…Cover Page Title: Achieving High Test Quality with Reduced Pin Count Testing Authors: 1. Jay…
Cited by 2 (0 self) – Add To MetaCart

Showing 1 through 1.

Try your query at: Scholar | Yahoo! | Ask | MS Live | CSB