Searching for "Accelerated test pattern generation by cone-oriented circuit partitioning." – sorted by Relevance.

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2 documents found, showing 1 through 2.

Accelerated Test Pattern Generation by Cone-Oriented Circuit Partitioning
by Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan — 1990 — Proc. European Design Automation Conference
…Abstract Accelerated Test Pattern Generation by Cone-Oriented Circuit Partitioning Torsten Grüning…
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Accelerated Test Pattern Generation by Cone-Oriented Circuit Partitioning
by Torsten Gr, Udo Mahlstedt, Wilfried Daehn Cengiz — 1990 — Proc. European Design Automation Conference
… Generation by Cone-Oriented Circuit Partitioning Torsten Gr��ning Udo Mahlstedt Wilfried Daehn Cengiz ��zcan…
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