Searching for authors named "Abhijit Chatterjee" – sorted by Relevance.
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RAFT: A Novel Program for Rapid-Fire Test and Diagnosis of Digital Logic for Marginal delays and Delay Faults
- AND DELAY FAULTS Abhijit Chatterjee, Georgia Institute of Technology, Atlanta, GA Jacob A. Abraham
- Cited by 1 (0 self) – Add To MetaCart
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258 OPTIMUS: A New Program for OPTIM izing Linear Circuits with Number-splitting and Shift-and-add Decompositions'
- -and-add Decompositions' Huy Nguyen and Abhijit Chatterjee School of Electrical Engineering Georgia Institute
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Test generation based diagnosis of device parameters for analog circuits
- & Abhijit Chatterjee Georgia Institute of Technology, Atlanta, GA-30332. {sashi, chat
- Cited by 4 (1 self) – Add To MetaCart
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Use of Embedded Sensors for Built-In-Test of RF Circuits
- Use of Embedded Sensors for Built-In-Test of RF Circuits Soumendu Bhattacharya, Abhijit Chatterjee
- Cited by 5 (0 self) – Add To MetaCart
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Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester
- , Abhijit Chatterjee Georgia Institute of Technology Email: shalabh@(email omitted); Abstract—This paper
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Probabilistic Compensation for Digital Filters under Pervasive Noise-Induced Operator Errors, accepted
- Maryam Ashouei, Soumendu Bhattacharya, and Abhijit Chatterjee School of Electrical and Computer
- Cited by 2 (1 self) – Add To MetaCart
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Modular fault simulation of mixed signal circuits with fault ranking by severity
- , Ramakrishna Voorakaranam and Abhijit Chatterjee School of Electrical and Computer Engineering Georgia
- Cited by 1 (0 self) – Add To MetaCart
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Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under
- -Die Variations Maryam Ashouei Muhammad M. Nisar Abhijit Chatterjee Georgia Institute of Technology Atlanta, GA
- Cited by 1 (0 self) – Add To MetaCart
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A Signature Test Framework for Rapid Production Testing of RF
- Cherubal and Abhijit Chatterjee ∗ Ardext Technologies, Atlanta, GA, 30318 Abstract Production test costs
- Cited by 7 (1 self) – Add To MetaCart
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Design of adaptive nanometer digital systems for effective control of soft error tolerance
- Abdulkadir U. Diril, Yuvraj S. Dhillon, and Abhijit Chatterjee Georgia Institute of Technology, Atlanta, GA
- Cited by 4 (2 self) – Add To MetaCart

