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A data-driven statistical approach to analyzing process variation
by Choongyeun Cho, Daeik Kim, Jonghae Kim, Jean-olivier Plouchart, Daihyun Lim, Sangyeun Cho, Robert Trzcinski — 2007 — in 65 nm SOI technology,” in Proc. Int. Symp. Quality Electronic Design
…A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology…
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